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Hitachi H-9500 High-resolution TEM

This is an high-resolution microscope with an accelerated voltage of 300 kV; a point-to-point resolution of 0.18 nm and a lattice resolution of 0.10 nm. A SC-1000 Orius® TEM CCD Camera (4008 x 2672 pixels) is attached to the microscope allowing quick and efficient searching of areas within the sample and viewing and recording high resolution images with ease. An EDAX EDS system is also attached allowing chemical analysis at the nanoscale.  

Hitachi H-7500 TEM

This TEM has accelerated voltages of 40 kV, 60 kV, 80kV, 100 kV and 120 kV. It is equipped with an AMT camera. This microscope is good for characterization of biological, polymer and inorganic materials. It is also an excellent tool for TEM teaching and training.

Hitachi S-3000N Variable Pressure SEM

This SEM has 3.0 nm resolution at high vacuum and 4.0 nm resolution at low vacuum. It is computer control for ultimate ease of use. Examination of insulating and biological samples is possible at low vacuum without the need of coating a conductive layer on the sample surface. This SEM is attached with a NORAN 7 Integrated EDS/EBSD system


 Hitachi S-4800 II FE-SEM

S-4800 II is an ultra-high-resolution SEM capable of ultra-low voltage imaging and handling large specimens up to 6" of a variety of sample types. It features a resolution of 1.0 nm, a variable acceleration voltage of .5 - 30 kV. It is capable of STEM imaging at 30kV, which is useful for STEM imaging for biological samples that cannot withstand high accelerating voltage in standard TEM. This SEM is attached with an EDAX EDS system allowing chemical composition analysis and elemental mapping.


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Hitachi S-5000H cold FE-SEM

Hitachi S-5000H is an ultra high-resolution SEM with a cold field emission source. It has a resolution of 0.6nm at 30 kV and 3.5 nm at 1 kV in secondary electron image. The magnification is from 30 x ~ 2000 for low mag mode and from 250 x ~ 1000000 X for high mag mode. This SEM has PCI Digital Imaging software for digital image recording.

FEI Strata 400 Dual Beam FIB

Strata 400 Dual Beam FIB/ FE-SEM system features ultra-high resolution (<1 nm) electron optics allowing for fast and simple high- resolution imaging for complete structural analysis and high-resolution Ion Optics (~7 nm) with optimized system architecture for automation with full access to E-beam, I-beam, patterning and gas chemistry functionality. It also equips with an Omniprobe sample extraction system for lift-out TEM specimen preparation.

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Perkin-Elmer Phi 560 XPS/Auger System

Phi 560 ESCA/SAM is a multi-technique surface analysis system to meet the most demanding needs of the surface scientist or materials analyst. It is equipped with a standard Mg/Al source. It has capabilities of XPS, and Auger and can provide surface composition; chemical state of elements at the near surface region and compositional depth profiling via Ar+ sputtering.

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Bruker D8 Advance X-ray diffractometer

It has the para-focusing Bragg-Brentano geometry and parallel beam geometry and 3 sample stages (rotational stage, compact Eulerian Cradle and reflectometry sample stage). It’s multi configurations for a variety of applications of phase identification, lattice mismatch and relaxation for epitaxial films; thin films grazing incidence diffraction of very thin films; texture analysis of orientation identification and residual stress determination of the films.

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Siemens D-500 X-ray diffractometer

This System performs theta - 2theta powder diffraction. 

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Park XE 70 AFM

This AFM is featured with compact mechanical design and flexible sample handling. It has 50 µm ?50 µm XY scan range, 12 µm Z scan range and a manual optics stage.

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Hysitron Ubi®1 Nano Indenter 

This instrument has capabilities for Nanoindentation (hardness and elastic modulus); Nanoscratch (friction, wear, etc.) and SPM imaging.

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 LECO LM 300 AT Micro Hardness Tester

Test load ranges from 1 to 2000 of  automatic video/image analysis system, auto turret, objective 50X.

Rockwell MRD Hardness Tester

Rockwell measures the bulk material hardness. Testing is performed on flat samples with smooth and clean surfaces. It can be quality control for metal heat treatment, incoming material inspection, weld evaluations in steels and other alloys, grade verification for hard plastics and failure analysis.

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The DXR Raman Microscope

TThis Raman microscope has high spatial resolution, confocal depth-profiling, mapping and the ease of sample preparation.

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Thermo Nicolet 6700 FTIR Spectrometer

This spectrometer is able to collect spectra in the mid-IR, far-IR and near-IR spectral ranges.

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 TA SDT-Q600 Simultaneous TGA / DSC

It provides simultaneous measurement of weight change and differential heat flow on the same sample from RT to 1500 °C

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Perkin-Elmer Thermogravimetric Analyzer (TGA7)

NETZSCH DSC 204 F1 Phoenix

It can study melting, crystallization; glass transition; oxidative stability; crystallinity of semicrystalline materials; solid-liquid ratio;  specific heat capacity;  cross-linking reaction; decomposition onset; solid-solid transition; polymorphism; liquid crystal transition; etc. in the temperature range between -85°C to 600°C.


Perkin-Elmer Differential Scanning Calorimeter (DSC7)

Optical Microscopes

Four optical microscopes furnished with a digital camera are available for general surface and microstructure observations: (1) Nikon labophot-2; (2) Nikon Eclipse L150; (3) Nikon Eclipse ME600 and (4) Nikon SMZ 1500.


SEM Sample Preparation Facility

Two sputtering systems: (1) CrC-100 and (2) Hummer VI are available for coating conductive layers on non-conductive samples for SEM observation.

Sample Section Machines

(1)      One Teckcut 5 cutting machine

(2)      Struers Labotom3 section machine

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Sample Surface Mechanical Polishing Facility

(1)  Two LECO BG-30 belt polishers with silicon carbide belts, zirconia oxide belts and aluminum oxide belts

(2)  LECO Vaari/POL VP-150 polishing station

(3)  Two LECO spectrum system 1000

(4)  Struers LaboPol-6 polisher

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Low Speed Diamond Saws

(1)  Buehler Isomet low speed saw

(2)  MTI 150 low speed diamond saw

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Gatan model 691 precise ion polishing systems (PIPS)

Gatan dual Ion mill polishing systems